@article {1588884,
	title = {Surface-plasmon quantum cascade microlasers with highly deformed resonators},
	journal = {IEEE Journal of Selected Topics in Quantum Electronics},
	volume = {12},
	number = {1},
	year = {2006},
	month = {Jan},
	pages = {66-70},
	abstract = {We report the demonstration of surface-plasmon microcylinder quantum cascade lasers with circular and deformed resonators. An improved self-alignment fabrication technique was developed that allows the use of wet etching, necessary to achieve smooth and clean surfaces, in combination with the deposition of the surface-plasmon-carrying metal layer up to the very edge of the resonator, where the optical mode is mostly located. The diameter of the microcylinders ranges from 75 to 180 /spl mu/m while their deformation coefficient /spl epsiv/ ranges from /spl epsiv/=0 to /spl epsiv/=0.32. Circular microcylinder lasers show a reduction of /spl sim/50\% of the threshold current density with respect to devices with standard ridge-waveguide resonators. On the other hand, highly deformed microcylinder lasers exhibit a complex mode structure, suggesting the onset of chaotic behavior.},
	keywords = {75 to 180 mum, chaotic behavior, circular resonators, clean surfaces, complex mode structure, deformation, deformation coefficient, deformed resonators, etching, laser modes, microcavity lasers, microcylinder lasers, Microdisk lasers, microlasers, midinfrared, optical chaos, optical mode, Optical resonators, optical surface waves, optical waveguides, Q factor, Quantum cascade lasers, quantum cascade microlasers, Quantum well lasers, ridge-waveguide resonators, self-alignment fabrication, smooth surfaces, Surface cleaning, Surface emitting lasers, surface plasmons, surface-plasmon microlasers, surface-plasmon-carrying metal layer, threshold current density, unipolar devices, waveguide lasers, wet etching},
	issn = {1558-4542},
	doi = {10.1109/JSTQE.2005.863000},
	author = {Colombelli, R. and Gmachl, C. and A. M. Sergent and Sivco, D. L. and E. E. Narimanov and V. A. Podolskiy and Cho, A. Y. and F. Capasso}
}
